Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7893703 | Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer | Yiping Feng, Shiyou Pei, Alexander Kagan, Jianou Shi, Sergio Edelstein | 2011-02-22 |
| 7187186 | Methods and systems for determining one or more properties of a specimen | Jianou Shi, Shiyou Pei, Zhiwei Xu, John Alexander | 2007-03-06 |
| 7110238 | Systems and methods for using non-contact voltage sensors and corona discharge guns | Zhiwei Xu, Jianou Shi, Shiyou Pei, Mahmood Mirzaaghaeian | 2006-09-19 |
| 6909291 | Systems and methods for using non-contact voltage sensors and corona discharge guns | Zhiwei Xu, Jianou Shi, Shiyou Pei, Mahmood Mirzaaghaeian | 2005-06-21 |
| 6862096 | Defect detection system | Mehdi Vaez-Iravani, Carl Treadwell, Andrew Zeng, Robert W. Fiordalice | 2005-03-01 |
| 6538730 | Defect detection system | Mehdi Vaez-Iravani, Carl Treadwell, Andrew Zeng, Robert W. Fiordalice | 2003-03-25 |