Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9140669 | Mapping density and temperature of a chip, in situ | David P. Vallett | 2015-09-22 |
| 8987843 | Mapping density and temperature of a chip, in situ | David P. Vallett | 2015-03-24 |
| 8729549 | Test structure and methodology for three-dimensional semiconductor structures | Kerry Bernstein, Christopher McCall Durham, Paul D. Kartschoke, Peter Juergen Klim, Donald L. Wheater | 2014-05-20 |
| 8294149 | Test structure and methodology for three-dimensional semiconductor structures | Kerry Bernstein, Christopher McCall Durham, Paul D. Kartschoke, Peter Juergen Klim, Donald L. Wheater | 2012-10-23 |
| 7230335 | Inspection methods and structures for visualizing and/or detecting specific chip structures | Steven J. Holmes, Leendert M. Huisman, Cherie R. Kagan, Leah Pastel, Paul William Pastel +2 more | 2007-06-12 |