IM

Ilya MALAKHOVSKY

AB Asml Netherlands B.V.: 4 patents #960 of 3,192Top 35%
Overall (All Time): #1,137,642 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
11300888 Methods of determining stress in a substrate, control system for controlling a lithographic process, lithographic apparatus and computer program product Richard Johannes Franciscus Van Haren, Leon Paul VAN DIJK, Ronald Henricus Johannes OTTEN 2022-04-12
11300889 Metrology apparatus Leon Paul VAN DIJK, Richard Johannes Franciscus Van Haren, Subodh Singh, Ronald Henricus Johannes OTTEN, Amandev Singh 2022-04-12
11226567 Methods and apparatus for use in a device manufacturing method Richard Johannes Franciscus Van Haren, Leon Paul VAN DIJK, Ronald Henricus Johannes OTTEN, Mahdi SADEGHINIA 2022-01-18
10192772 Substrate table and lithographic apparatus Satish Achanta, Tiannan GUAN, Raymond Wilhelmus Louis Lafarre, Bas Johannes Petrus ROSET, Siegfried Alexander Tromp +1 more 2019-01-29