II

Igor Iosilevsky

PM Phase Metrics: 2 patents #10 of 49Top 25%
Overall (All Time): #2,246,818 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5875029 Apparatus and method for surface inspection by specular interferometric and diffuse light detection Peter C. Jann, Wayne Li, Kenneth H. Womack, Vlastimil Cejna, George A. Burt, Jr. 1999-02-23
5792947 Method and apparatus for combined glide and defect analysis Vladimir Pogrebinsky, George A. Burt, Jr., David H. Ferry 1998-08-11