Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11300529 | Analysis apparatus, analysis method and analysis program | Atsushi Ohbuchi, Takayuki Konya, Akihiro Himeda | 2022-04-12 |
| 7860217 | X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same | Tetsuya Ozawa, Ryuji Matsuo, Akira Echizenya | 2010-12-28 |
| 7542548 | X-ray optical system | Ryuji Matsuo, Akira Echizenya | 2009-06-02 |
| 6990177 | X-ray optical system for small angle scattering | Hitoshi Okanda | 2006-01-24 |
| 6917667 | Method and apparatus for making parallel X-ray beam and X-ray diffraction apparatus | Hitoshi Okanda | 2005-07-12 |
| 6807251 | X-ray diffraction apparatus | Hitoshi Okanda | 2004-10-19 |
| 6307917 | Soller slit and X-ray apparatus | Katsuhiko Shimizu, Kazuhiko Omote | 2001-10-23 |
| 6266392 | Soller slit and manufacturing method of the same | Shiro Umegaki | 2001-07-24 |