FN

Franz Neppl

SA Siemens Aktiengesellschaft: 22 patents #259 of 22,248Top 2%
Overall (All Time): #198,923 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
5597766 Method for detaching chips from a wafer 1997-01-28
5100811 Integrated circuit containing bi-polar and complementary MOS transistors on a common substrate and method for the manufacture thereof Josef Winnerl 1992-03-31
5034338 Circuit containing integrated bipolar and complementary MOS transistors on a common substrate Josef Winnerl 1991-07-23
5013678 Method of making an integrated circuit comprising load resistors arranged on the field oxide zones which separate the active transistor zones Josef Winnerl 1991-05-07
4960489 Method for self-aligned manufacture of contacts between interconnects contained in wiring levels arranged above one another in an integrated circuit Guenther Roeska, Josef Winnerl 1990-10-02
4912543 Integrated semiconductor circuit having an external contacting track level consisting of aluminum or of an aluminum alloy Ulrich Schwabe 1990-03-27
4906585 Method for manufacturing wells for CMOS transistor circuits separated by insulating trenches Carlos Mazure-Espejo, Christoph Zeller 1990-03-06
4885617 Metal-oxide semiconductor (MOS) field effect transistor having extremely shallow source/drain zones and silicide terminal zones, and a process for producing the transistor circuit C. A. Mazure-Espejo 1989-12-05
4884117 Circuit containing integrated bipolar and complementary MOS transistors on a common substrate Josef Winnerl 1989-11-28
4874717 Semiconductor circuit containing integrated bipolar and MOS transistors on a chip and method of producing same Ulrich Schwabe 1989-10-17
4855245 Method of manufacturing integrated circuit containing bipolar and complementary MOS transistors on a common substrate Josef Winnerl 1989-08-08
4803179 Methods for making neighboring wells for VLS1 CMOS components Carlos-Alberto Mazure-Espejo 1989-02-07
4782033 Process for producing CMOS having doped polysilicon gate by outdiffusion of boron from implanted silicide gate Heike Gierisch 1988-11-01
4761384 Forming retrograde twin wells by outdiffusion of impurity ions in epitaxial layer followed by CMOS device processing Erwin Jacobs, Josef Winnerl, Carlos-Alberto Mazure-Espejo 1988-08-02
4740479 Method for the manufacture of cross-couplings between n-channel and p-channel CMOS field effect transistors of static write-read memories Konrad Hieber, Ulrich Schwabe 1988-04-26
4680612 Integrated semiconductor circuit including a tantalum silicide diffusion barrier Konrad Hieber, Konrad Schober 1987-07-14
4673968 Integrated MOS transistors having a gate metallization composed of tantalum or niobium or their silicides Konrad Hieber 1987-06-16
4640844 Method for the manufacture of gate electrodes formed of double layers of metal silicides having a high melting point and doped polycrystalline silicon Ulrich Schwabe, Konrad Hieber 1987-02-03
4603472 Method of making MOS FETs using silicate glass layer as gate edge masking for ion implantation Ulrich Schwabe, Erwin Jacobs 1986-08-05
4525378 Method for manufacturing VLSI complementary MOS field effect circuits Ulrich Schwabe, Erwin Jacobs 1985-06-25
4510670 Method for the manufacture of integrated MOS-field effect transistor circuits silicon gate technology having diffusion zones coated with silicide as low-impedance printed conductors Ulrich Schwabe, Konrad Hieber 1985-04-16
4505027 Method of making MOS device using metal silicides or polysilicon for gates and impurity source for active regions Ulrich Schwabe, Ulf Burker, Werner Christoph 1985-03-19