Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4823073 | Sensor for measuring the current or voltage of electrically conductive layers present on a reference substrate | — | 1989-04-18 |
| 4680612 | Integrated semiconductor circuit including a tantalum silicide diffusion barrier | Konrad Hieber, Franz Neppl | 1987-07-14 |