Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10018667 | Method for testing semiconductor dies | Michael Leutschacher, Christian Musshoff, Stefan Kramp | 2018-07-10 |
| 9435849 | Method for testing semiconductor dies and a test apparatus | Michael Leutschacher, Christian Musshoff, Stefan Kramp | 2016-09-06 |
| 7353425 | Data processing circuit apparatus having a data transmission unit of redundant design | — | 2008-04-01 |
| 7343532 | Testing memory units in a digital circuit | — | 2008-03-11 |
| 7340313 | Monitoring device for monitoring internal signals during initialization of an electronic circuit | Manfred Moser, Martin Versen | 2008-03-04 |
| 7321497 | Electronic circuit apparatus and method for stacking electronic circuit units | Sven Boldt | 2008-01-22 |
| 7308622 | Integrated memory and method for testing the memory | Sven Boldt | 2007-12-11 |
| 7292479 | Memory device with multistage sense amplifier | Sven Boldt | 2007-11-06 |
| 7276896 | Test apparatus and method for testing circuit units to be tested | Manfred Moser, Daniel Mysliwitz | 2007-10-02 |
| 7254758 | Method and apparatus for testing circuit units to be tested with different test mode data sets | — | 2007-08-07 |
| 7228477 | Apparatus and method for testing circuit units to be tested | — | 2007-06-05 |
| 7191085 | Method for testing an electric circuit | Thomas Neyer, Martin Versen | 2007-03-13 |
| 7188291 | Circuit and method for testing a circuit having memory array and addressing and control unit | — | 2007-03-06 |
| 7184335 | Electronic memory apparatus, and method for deactivating redundant bit lines or word lines | Sven Boldt | 2007-02-27 |
| 7143325 | Method for testing circuit units to be tested by means of majority decisions and test device for performing the method | — | 2006-11-28 |
| 7039544 | Method for testing circuit units to be tested and test apparatus | — | 2006-05-02 |
| 6897646 | Method for testing wafers to be tested and calibration apparatus | Thomas Grebner, Hans-Christoph Ostendorf, Michael Schittenhelm | 2005-05-24 |
| 6882139 | Electronic component, tester device and method for calibrating a tester device | Thomas Grebner | 2005-04-19 |