Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10018667 | Method for testing semiconductor dies | Erwin Thalmann, Michael Leutschacher, Stefan Kramp | 2018-07-10 |
| 9435849 | Method for testing semiconductor dies and a test apparatus | Erwin Thalmann, Michael Leutschacher, Stefan Kramp | 2016-09-06 |
| 7265564 | Method for testing a contact region of a semiconductor module | Ralf Otremba, Josef Höglauer, Jens Oetjen | 2007-09-04 |