ES

Eric J. Strang

TL Tokyo Electron Limited: 62 patents #35 of 5,567Top 1%
IBM: 2 patents #32,839 of 70,183Top 50%
Overall (All Time): #36,847 of 4,157,543Top 1%
62
Patents All Time

Issued Patents All Time

Showing 25 most recent of 62 patents

Patent #TitleCo-InventorsDate
11745202 Dry non-plasma treatment system Martin Kent 2023-09-05
9139910 Method for chemical vapor deposition control Eric M. Lee, Jacques Faguet 2015-09-22
9115429 Dry non-plasma treatment system and method of using Martin Kent 2015-08-25
8927907 Thermally zoned substrate holder assembly Steven Fink 2015-01-06
8877000 Shower head gas injection apparatus with secondary high pressure pulsed gas injection 2014-11-04
8852347 Apparatus for chemical vapor deposition control Eric M. Lee, Jacques Faguet 2014-10-07
8828185 Dry non-plasma treatment system and method of using Martin Kent 2014-09-09
8562743 Method and apparatus for atomic layer deposition 2013-10-22
8296687 System and method for using first-principles simulation to analyze a process performed by a semiconductor processing tool Andrej Mitrovic 2012-10-23
8207476 Temperature controlled substrate holder with non-uniform insulation layer for a substrate processing system Yuji Tsukamoto 2012-06-26
8092602 Thermally zoned substrate holder assembly Steven Fink 2012-01-10
8073667 System and method for using first-principles simulation to control a semiconductor manufacturing process Andrej Mitrovic 2011-12-06
8050900 System and method for using first-principles simulation to provide virtual sensors that facilitate a semiconductor manufacturing process Andrej Mitrovic 2011-11-01
8038834 Method and system for controlling radical distribution Merritt Funk, David V. Horak, Lee Chen 2011-10-18
8036869 System and method for using first-principles simulation to control a semiconductor manufacturing process via a simulation result or a derived empirical model Andrej Mitrovic 2011-10-11
8032348 System and method for using first-principles simulation to facilitate a semiconductor manufacturing process Andrej Mitrovic 2011-10-04
8014991 System and method for using first-principles simulation to characterize a semiconductor manufacturing process Andrej Mitrovic 2011-09-06
7740704 High rate atomic layer deposition apparatus and method of using 2010-06-22
7732227 Method and apparatus for wall film monitoring Richard Parsons 2010-06-08
7723648 Temperature controlled substrate holder with non-uniform insulation layer for a substrate processing system Yuji Tsukamoto 2010-05-25
7718032 Dry non-plasma treatment system and method of using Martin Kent 2010-05-18
7718030 Method and system for controlling radical distribution Merritt Funk, David V. Horak, Lee Chen 2010-05-18
7666479 Apparatus and method of gas injection sequencing 2010-02-23
7582186 Method and apparatus for an improved focus ring in a plasma processing system Steven Fink 2009-09-01
7563328 Method and apparatus for gas injection system with minimum particulate contamination 2009-07-21