Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5301124 | Registration of patterns formed of multiple fields | Ken Chan, Donald E. Davis, William A. Enichen, Cecil T. Ho, Guenther O. Langner | 1994-04-05 |
| 5285074 | Dynamic compensation of non-linear electron beam landing angle in variable axis lenses | Don F. Haire, Cecil T. Ho, Guenther O. Langner, Werner Stickel | 1994-02-08 |
| 4581537 | Method for generating inspection patterns | Wallace J. Guillaume, John F. Loughran, Jan Rogoyski, Robert A. Simpson | 1986-04-08 |
| 4546260 | Alignment technique | Robert A. Simpson, Ralph R. Trotter | 1985-10-08 |
| 4365163 | Pattern inspection tool - method and apparatus | Donald E. Davis, Richard D. Moore, Philip M. Ryan | 1982-12-21 |
| 4243866 | Method and apparatus for forming a variable size electron beam | Hans C. Pfeiffer, Philip M. Ryan | 1981-01-06 |