Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7352170 | Exhaustive diagnosis of bridging defects in an integrated circuit including multiple nodes using test vectors and IDDQ measurements | — | 2008-04-01 |
| 7064570 | Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester | Patrick H. Buffet, Leah Pastel, Yu Sun | 2006-06-20 |
| 6901542 | Internal cache for on chip test data storage | Thomas Bartenstein, L. Farnsworth, Edward E. Horton, III, Leendert M. Huisman, Leah Pastel +3 more | 2005-05-31 |
| 6721914 | Diagnosis of combinational logic circuit failures | Thomas Bartenstein, Leendert M. Huisman | 2004-04-13 |
| 6677774 | Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester | Patrick H. Buffet, Leah Pastel, Yu Sun | 2004-01-13 |
| 6675323 | Incremental fault dictionary | Thomas Bartenstein, Leendert M. Huisman, Thomas F. Mechler, Leah Pastel, Glen E. Richard +1 more | 2004-01-06 |