Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8532949 | Computer-implemented methods and systems for classifying defects on a specimen | Cho H. Teh, Tommaso Torelli, Chiuman Yeung, Michael Gordon Scott, Lalita A. Balasubramanian +5 more | 2013-09-10 |
| 8392136 | In-place management of semiconductor equipment recipes | Chris W. Lee | 2013-03-05 |
| 7047101 | Reuse in semiconductor measurement recipes | Scott Young | 2006-05-16 |