Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12283794 | Polarised emission from quantum wires in cubic GaN | Rachel A. OLIVER, Menno Kappers, Philip Dawson, Stephen Church, David Binks | 2025-04-22 |
| 11817315 | Zincblende structure group III-nitride | Martin Frentrup, Menno Kappers, Suman-Lata Sahonta | 2023-11-14 |
| 11302530 | Zincblende structure group III-nitride | Martin Frentrup, Menno Kappers, Suman-Lata Sahonta | 2022-04-12 |
| 8575595 | P-type semiconductor devices | — | 2013-11-05 |
| 7390742 | Method for producing a rewiring printed circuit board | Axel Brintzinger, Stefan Ruckmich, Octavio Trovarelli, Ingo Uhlendorf | 2008-06-24 |
| 7323764 | Buffer structure for modifying a silicon substrate | — | 2008-01-29 |
| 7235859 | Arrangement and process for protecting fuses/anti-fuses | Axel Brintzinger, Octavio Trovarelli, Wolfgang Leiberg | 2007-06-26 |
| 7169647 | Connection between a semiconductor chip and an external conductor structure and method for producing it | Octavio Trovarelli, Ingo Uhlendorf, Axel Brintzinger | 2007-01-30 |
| 6907107 | Method and apparatus for the analysis of material composition | Andrew Keir, Martin Trevor Emeny | 2005-06-14 |
| 6752694 | Apparatus for and method of wafer grinding | Manfred Schneegans, Michael Roesner | 2004-06-22 |
| 6709953 | Method of applying a bottom surface protective coating to a wafer, and wafer dicing method | Barbara Vasquez, Sylvia Baumann Winter | 2004-03-23 |
| 6633379 | Apparatus and method for measuring the degradation of a tool | Michael Roesner, Manfred Schneegans | 2003-10-14 |