| 7449682 |
System and method for depth profiling and characterization of thin films |
Paul E. Larson, John F. Moulder, David G. Watson |
2008-11-11 |
| 5226118 |
Data analysis system and method for industrial process control systems |
Michael Baker, Leslie A. Lane, Alexander Freedland |
1993-07-06 |
| 4967381 |
Process control interface system for managing measurement data |
Leslie A. Lane, Lynn V. Lybeck, Shoji Kumagi |
1990-10-30 |
| 4951190 |
Multilevel menu and hierarchy for selecting items and performing tasks thereon in a computer system |
Leslie A. Lane, Lynn V. Lybeck, Chester L. Mallory |
1990-08-21 |
| 4873623 |
Process control interface with simultaneously displayed three level dynamic menu |
Leslie A. Lane, Lynn V. Lybeck, Shoji Kumagi |
1989-10-10 |
| 4843538 |
Multi-level dynamic menu which suppresses display of items previously designated as non-selectable |
Leslie A. Lane, Lynn V. Lybeck, Chester L. Mallory |
1989-06-27 |
| 4805089 |
Process control interface system for managing measurement data |
Leslie A. Lane, Lynn V. Lybeck, Chester L. Mallory |
1989-02-14 |
| 4755746 |
Apparatus and methods for semiconductor wafer testing |
Chester L. Mallory, Hung Pham, Sandor Droblisch |
1988-07-05 |
| 4703252 |
Apparatus and methods for resistivity testing |
Chester L. Mallory |
1987-10-27 |
| 4679137 |
Process control interface system for designer and operator |
Leslie A. Lane, Lynn V. Lybeck, Chester L. Mallory |
1987-07-07 |