Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7449682 | System and method for depth profiling and characterization of thin films | Paul E. Larson, David G. Watson, David S. Perloff | 2008-11-11 |
| 6800852 | Nondestructive characterization of thin films using measured basis spectra | Paul E. Larson, David G. Watson | 2004-10-05 |
| 4513905 | Integrated circuit metallization technique | Ronald S. Nowicki | 1985-04-30 |