Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9159539 | Method and apparatus to provide parallel acquisition of mass spectrometry/mass spectrometry data | John S. Hammond, Gregory L. Fisher, Ron M. Heeren | 2015-10-13 |
| 8071942 | Sample holder apparatus to reduce energy of electrons in an analyzer system and method | David G. Watson, Dennis F. Paul, Ronald E. Negri | 2011-12-06 |
| 7529858 | Hard disk drive controller having versatile chip connector having printed circuit board engaged by at least two data ports having two pairs of differential connector elements | Philip Joseph Engelmeyer, Miroki Nonaka, Dennis Carl Mairet | 2009-05-05 |
| 7449682 | System and method for depth profiling and characterization of thin films | John F. Moulder, David G. Watson, David S. Perloff | 2008-11-11 |
| 7334052 | Versatile dual port connector element arrangement | Philip Joseph Engelmeyer, Hiroki Nonaka, Dennis Carl Mairet | 2008-02-19 |
| 6891158 | Nondestructive characterization of thin films based on acquired spectrum | David G. Watson | 2005-05-10 |
| 6800852 | Nondestructive characterization of thin films using measured basis spectra | David G. Watson, John F. Moulder | 2004-10-05 |
| 5990476 | Control of surface potential of insulating specimens in surface analysis | Michael A. Kelly | 1999-11-23 |
| 5602899 | Anode assembly for generating x-rays and instrument with such anode assembly | — | 1997-02-11 |
| 5444242 | Scanning and high resolution electron spectroscopy and imaging | Paul W. Palmberg | 1995-08-22 |
| 5315113 | Scanning and high resolution x-ray photoelectron spectroscopy and imaging | Paul W. Palmberg | 1994-05-24 |
| 5118941 | Apparatus and method for locating target area for electron microanalysis | — | 1992-06-02 |
| 4329149 | Method for spectrophotometric compensation for colorimetric reagent variation | David J. Schoonover | 1982-05-11 |
| 4198161 | Low turbidity nephelometer | — | 1980-04-15 |