PL

Paul E. Larson

RI Revera, Incorporated: 3 patents #6 of 24Top 25%
HC Hach Chemical: 2 patents #2 of 7Top 30%
HG HGST: 2 patents #738 of 1,677Top 45%
PE Perkinelmer: 2 patents #151 of 671Top 25%
UI Ulvac-Phi, Incorporated: 1 patents #6 of 25Top 25%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
Overall (All Time): #351,972 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9159539 Method and apparatus to provide parallel acquisition of mass spectrometry/mass spectrometry data John S. Hammond, Gregory L. Fisher, Ron M. Heeren 2015-10-13
8071942 Sample holder apparatus to reduce energy of electrons in an analyzer system and method David G. Watson, Dennis F. Paul, Ronald E. Negri 2011-12-06
7529858 Hard disk drive controller having versatile chip connector having printed circuit board engaged by at least two data ports having two pairs of differential connector elements Philip Joseph Engelmeyer, Miroki Nonaka, Dennis Carl Mairet 2009-05-05
7449682 System and method for depth profiling and characterization of thin films John F. Moulder, David G. Watson, David S. Perloff 2008-11-11
7334052 Versatile dual port connector element arrangement Philip Joseph Engelmeyer, Hiroki Nonaka, Dennis Carl Mairet 2008-02-19
6891158 Nondestructive characterization of thin films based on acquired spectrum David G. Watson 2005-05-10
6800852 Nondestructive characterization of thin films using measured basis spectra David G. Watson, John F. Moulder 2004-10-05
5990476 Control of surface potential of insulating specimens in surface analysis Michael A. Kelly 1999-11-23
5602899 Anode assembly for generating x-rays and instrument with such anode assembly 1997-02-11
5444242 Scanning and high resolution electron spectroscopy and imaging Paul W. Palmberg 1995-08-22
5315113 Scanning and high resolution x-ray photoelectron spectroscopy and imaging Paul W. Palmberg 1994-05-24
5118941 Apparatus and method for locating target area for electron microanalysis 1992-06-02
4329149 Method for spectrophotometric compensation for colorimetric reagent variation David J. Schoonover 1982-05-11
4198161 Low turbidity nephelometer 1980-04-15