David W. Daniel — 18 Patents | Patent Leaderboard

David W. Daniel has been granted 18 US patents. The first was granted in 1999 and the most recent in August 2021. David W. Daniel ranks #245,716 of 4,157,543 US inventors in our database (top 5.9%). Patent records list David W. Daniel in Divide, CO, US.

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Showing 1–18 of 18 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11095675	System and method for identifying system vulnerabilities	David Clark, Kevin J. Sullivan, Jane L M Kuberski, Paul J. Melko, Jr., Narayanasamy Balakrishnan +4 more	2021-08-17
7095483	Process independent alignment marks	James R. B. Elmer	2006-08-22	$3,850,000
6870160	Method and apparatus for monitoring the condition of a lubricating medium	—	2005-03-22	$2,090,000
6856029	Process independent alignment marks	James R. B. Elmer	2005-02-15	$5,122,000
6506684	Anti-corrosion system	Dodd Defibaugh	2003-01-14	$5,401,000
6372520	Sonic assisted strengthening of gate oxides	Kang-Jay Hsia, George H. Maggard	2002-04-16	$20,336,000
6354908	Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system	Derryl D. J. Allman, John Gregory	2002-03-12	$24,274,000
6355532	Subtractive oxidation method of fabricating a short-length and vertically-oriented channel, dual-gate, CMOS FET	John J. Seliskar, Verne Hornback	2002-03-12	$24,274,000
6316817	MeV implantation to form vertically modulated N+ buried layer in an NPN bipolar transistor	John J. Seliskar, Todd A. Randazzo	2001-11-13	$23,602,000
6241847	Method and apparatus for detecting a polishing endpoint based upon infrared signals	Derryl D. J. Allman, John Gregory	2001-06-05	$27,808,000
6235590	Fabrication of differential gate oxide thicknesses on a single integrated circuit chip	Dianne G. Pinello, Michael F. Chisholm	2001-05-22	$33,865,000
6201253	Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system	Derryl D. J. Allman, John Gregory	2001-03-13	$28,061,000
6121147	Apparatus and method of detecting a polishing endpoint layer of a semiconductor wafer which includes a metallic reporting substance	John Gregory, Derryl D. J. Allman	2000-09-19	$25,929,000
6096625	Method for improved gate oxide integrity on bulk silicon	Theodore Moore, Crystal J. Hass	2000-08-01	$23,151,000
6077783	Method and apparatus for detecting a polishing endpoint based upon heat conducted through a semiconductor wafer	Derryl D. J. Allman, Michael F. Chisholm	2000-06-20	$83,568,000
6069048	Reduction of silicon defect induced failures as a result of implants in CMOS and other integrated circuits	—	2000-05-30	$26,487,000
5966599	Method for fabricating a low trigger voltage silicon controlled rectifier and thick field device	John D. Walker	1999-10-12	$29,372,000
5858828	Use of MEV implantation to form vertically modulated N+ buried layer in an NPN bipolar transistor	John J. Seliskar, Todd A. Randazzo	1999-01-12

David W. Daniel — 18 Patents

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