Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Process independent alignment marks

Process independent alignment marks

US Patent 6856029 · Granted Feb 15, 2005

Estimated economic value: $5,122,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for identifying system vulnerabilities2021
Self-aligned cell integration scheme2011
Techniques for precision pattern transfer of carbon nanotubes from photo mask to2011
Techniques for precision pattern transfer of carbon nanotubes from photo mask to2009
Integrated circuit process monitoring and metrology system2006
Process independent alignment marks2006
Process independent alignment marks2006
Reticle overlay correction2006
Integrated circuit process monitoring and metrology system2005
Method and apparatus for monitoring the condition of a lubricating medium2005
Selective high k dielectrics removal2004
Multi pattern reticle2004