Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuit process monitoring and metrology system

Integrated circuit process monitoring and metrology system

US Patent 6964924 · Granted Nov 15, 2005

Estimated economic value: $9,957,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Process of forming an electronic device including a component structure adjacent2025
Method for forming transistor devices having source region segments and body reg2025
Methods and structures for contacting shield conductor in a semiconductor device2025
Method for matching a coating of any gloss level2025
Integrated transistor and resistor-diode-capacitor snubber2024
Methods and structures for contacting shield conductor in a semiconductor device2024
Transistor device having a source region segments and body region segments2024
Visualizing wood staining2024
Semiconductor device and structure therefor2023
Transistor device having a source region segments and body region segments2023
Methods and structures for contacting shield conductor in a semiconductor device2022
Semiconductor devices with low resistance gate and shield electrodes and methods2022