Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10916462 | Laser marking focus feedback system having an intensity indication of reflected radiation passed through an objective lens, a beam splitter and a pinhole | Timothy Russin, Shiyu Zhang, Daniel L. Kapp | 2021-02-09 |
| 10890719 | Optical interconnect for switch applications | John Heanue, Bardia Pezeshki, Lucas Soldano | 2021-01-12 |
| 10178452 | Optical interconnect having optical splitters and modulators integrated on same chip | Bardia Pezeshki, John Heanue, Lucas Soldano | 2019-01-08 |
| 10082470 | Defect marking for semiconductor wafer inspection | David W. Shortt, Steven R. Lange, Junwei Wei, Daniel L. Kapp | 2018-09-25 |
| 8755044 | Large particle detection for multi-spot surface scanning inspection systems | Juergen Reich, Jiayao Zhang, Christian Wolters | 2014-06-17 |