| 9831098 |
Methods for fabricating integrated circuits using flowable chemical vapor deposition techniques with low-temperature thermal annealing |
Xinyuan Dou, Sukwon Hong, Satyajit Shinde, Sandeep Gaan, Tao Han +1 more |
2017-11-28 |
| 6664800 |
Non-contact method for determining quality of semiconductor dielectrics |
Sundar Srinivasan Chetlur, Pradip K. Roy |
2003-12-16 |
| 6548422 |
Method and structure for oxide/silicon nitride interface substructure improvements |
Pradip K. Roy, David C. Brady |
2003-04-15 |
| 6391668 |
Method of determining a trap density of a semiconductor/oxide interface by a contactless charge technique |
Sundar Chetlur, Brian E. Harding, Minesh Patel, Pradip K. Roy |
2002-05-21 |
| 6265890 |
In-line non-contact depletion capacitance measurement method and apparatus |
Sailesh Chittipeddi, Pradip K. Roy |
2001-07-24 |
| 6255128 |
Non-contact method for determining the presence of a contaminant in a semiconductor device |
Pradip K. Roy |
2001-07-03 |
| 6251697 |
Non-contact method for monitoring and controlling plasma charging damage in a semiconductor device |
Pradip K. Roy |
2001-06-26 |
| 6207468 |
Non-contact method for monitoring and controlling plasma charging damage in a semiconductor device |
Pradip K. Roy |
2001-03-27 |
