Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11892501 | Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns | Joseph Michael Swenton, Martin Thomas Amodeo | 2024-02-06 |
| 11893336 | Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chip | Joseph Michael Swenton, Martin Thomas Amodeo | 2024-02-06 |
| 11740284 | Diagnosing multicycle faults and/or defects with single cycle ATPG test patterns | Joseph Michael Swenton, Martin Thomas Amodeo | 2023-08-29 |
| 11579194 | Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defects | Joseph Michael Swenton, Martin Thomas Amodeo | 2023-02-14 |
| 11461520 | SDD ATPG using fault rules files, SDF and node slack for testing an IC chip | Joseph M. Swenton, Santosh Subhaschandra Malagi | 2022-10-04 |
| 11435401 | Timed transition cell-aware ATPG using fault rule files and SDF for testing an IC chip | Joseph Michael Swenton, Santosh Subhaschandra Malagi | 2022-09-06 |
| 11429776 | Fault rules files for testing an IC chip | Joseph Michael Swenton, Santosh Subhaschandra Malagi | 2022-08-30 |