Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11969238 | Physiological parameter detecting apparatus and method of detecting physiological parameters | Alexey Andreevich Shchekin, Maxim Vladimirovich Riabko, Alexey Dmitrievich Lantsov, Sergey Nikolaevich Koptyaev | 2024-04-30 |
| 11922606 | Multipass interference correction and material recognition based on patterned illumination without frame rate loss | Vladimir Mikhailovich SEMENOV, Anastasiia Sergeevna Suvorina, Vladislav Valer'evich Lychagov, Evgeny Andreevich Dorokhov, Gennady Dmitrievich Mammykin | 2024-03-05 |
| 11823961 | Substrate inspection system and method of manufacturing semiconductor device using substrate inspection system | Eunhee Jeang, BORIS AFINOGENOV, Sangwoo Bae, Wondon Joo, Maksim Riabko +7 more | 2023-11-21 |
| 11470287 | Color imaging apparatus using monochrome sensors for mobile devices | Sergey Nikolaevich Koptyaev, Maxim Vladimirovich Riabko, Alexey Andreevich Shchekin, Aleksandr Sergeevich Shorokhov | 2022-10-11 |
| 11045103 | Physiological parameter detecting apparatus and method of detecting physiological parameters | Alexey Andreevich Shchekin, Maxim Vladimirovich Riabko, Alexey Dmitrievich Lantsov, Sergey Nikolaevich Koptyaev | 2021-06-29 |
| 10816480 | Method of detecting a defect on a substrate, apparatus for performing the same and method of manufacturing semiconductor device using the same | Eun Hee Jeang, Aleksandr Sergeevich Shorokhov, Maksim Riabko, Sang Woo BAE, Akinori Okubo +3 more | 2020-10-27 |
| 10296776 | Device and method for biometrics authentication | Alexey Dmitrievich Lantsov, Alexey Andreevich Shchekin, Maksim Riabko, Sergey Nikolaevich Koptyaev | 2019-05-21 |
| 10224688 | Optical dual-comb source apparatuses including optical microresonator | Sergey Nikolaevich Koptyaev, Grigoriy Vasil'evich Lihachev, Nikolay Pavlov, Alexey Andreevich Shchekin, Igor Antonovich Bilenko +6 more | 2019-03-05 |
| 9995648 | Optical measurement system and method for measuring critical dimension of nanostructure | Alexey Andreevich Shchekin, Maksim Riabko, Sergey Nikolaevich Koptyaev | 2018-06-12 |