Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12389089 | Thermal sensor, thermal sensor array, electronic apparatus including the thermal sensor, and operating method of the thermal sensor | Anton SOFRONOV, Maxim Vladimirovich Ryabko | 2025-08-12 |
| 12350013 | Spectrometer including tunable on-chip laser and spectrum measurement method | Alexey Dmitrievich Lantsov, Alexey Andreevich Shchekin, Alexey Grigorievich Anikanov, Maksim Vladimirovich Ryabko, Pavel Alexandrovich Ivshin +2 more | 2025-07-08 |
| 12284427 | Infrared detector and infrared image sensor including the same | Maxim Vladimirovich Ryabko, Anton SOFRONOV | 2025-04-22 |
| 11969238 | Physiological parameter detecting apparatus and method of detecting physiological parameters | Alexey Andreevich Shchekin, Maxim Vladimirovich Riabko, Anton Sergeevich MEDVEDEV, Alexey Dmitrievich Lantsov | 2024-04-30 |
| 11804694 | Laser device and method of transforming laser spectrum | Igor Antonovich Bilenko, Vitali Valentinovich Vasiliev, Andrey Sergeevich Voloshin, Grigoriy Vasil'evich Lihachev, Valery Evgenievich Lobanov +4 more | 2023-10-31 |
| 11470287 | Color imaging apparatus using monochrome sensors for mobile devices | Anton Sergeevich MEDVEDEV, Maxim Vladimirovich Riabko, Alexey Andreevich Shchekin, Aleksandr Sergeevich Shorokhov | 2022-10-11 |
| 11045103 | Physiological parameter detecting apparatus and method of detecting physiological parameters | Alexey Andreevich Shchekin, Maxim Vladimirovich Riabko, Anton Sergeevich MEDVEDEV, Alexey Dmitrievich Lantsov | 2021-06-29 |
| 10296776 | Device and method for biometrics authentication | Alexey Dmitrievich Lantsov, Alexey Andreevich Shchekin, Maksim Riabko, Anton Sergeevich MEDVEDEV | 2019-05-21 |
| 10224688 | Optical dual-comb source apparatuses including optical microresonator | Grigoriy Vasil'evich Lihachev, Nikolay Pavlov, Alexey Andreevich Shchekin, Igor Antonovich Bilenko, Maxim Vladimirovich Riabko +6 more | 2019-03-05 |
| 9995648 | Optical measurement system and method for measuring critical dimension of nanostructure | Alexey Andreevich Shchekin, Maksim Riabko, Anton Sergeevich MEDVEDEV | 2018-06-12 |
| 9360662 | Optical measurement system and method for measuring critical dimension of nanostructure | Maxim Vladimirovich Ryabko, Michael Nikolaevich Rychagov | 2016-06-07 |
| 9322640 | Optical measuring system and method of measuring critical size | Maxim Vladimirovich Ryabko, Alexander Vyacheslavovich Shcherbakov, Alexey Dmitrievich Lantsov | 2016-04-26 |