AV

Alexander Volfman

KL Kla: 1 patents #347 of 758Top 50%
📍 Milpitas, CA: #2,135 of 3,192 inventorsTop 70%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11378394 On-the-fly scatterometry overlay metrology target Yuri Paskover, Itay Gdor, Yuval Lubashevksy, Vladimir Levinski, Yoram Uziel 2022-07-05