Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11016038 | Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structure | Nobukatsu MACHII, Fuminori Hayano | 2021-05-25 |
| 11016039 | Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structure | Nobukatsu MACHII, Fuminori Hayano | 2021-05-25 |
| 10809209 | Measurement processing device, x-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method | Hirotomo Yashima, Fuminori Hayano | 2020-10-20 |
| 10760902 | Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection program | Nobukatsu MACHII, Fuminori Hayano | 2020-09-01 |
| 10557706 | Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection program | Nobukatsu MACHII, Fuminori Hayano | 2020-02-11 |
| 10481106 | Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method | Hirotomo Yashima, Fuminori Hayano | 2019-11-19 |
| 8730465 | Polarized light defect detection in pupil images | Kazumasa Endo, Daisaku Mochida, Toru Yoshikawa, Hiromasa Shibata | 2014-05-20 |
| 6405610 | Wafer inspection apparatus | Manabu Komatsu, Kurata Honma, Hisashi Tazawa, Tsuneo Hasegawa | 2002-06-18 |