Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11016038 | Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structure | Fuminori Hayano, Akitoshi Kawai | 2021-05-25 |
| 11016039 | Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structure | Fuminori Hayano, Akitoshi Kawai | 2021-05-25 |
| 10760902 | Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection program | Fuminori Hayano, Akitoshi Kawai | 2020-09-01 |
| 10557706 | Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection program | Fuminori Hayano, Akitoshi Kawai | 2020-02-11 |