YC

Younes Chtioui

SP Semiconductor Technologies & Instruments Pte: 1 patents #19 of 43Top 45%
📍 Dallas, TX: #4,358 of 7,543 inventorsTop 60%
🗺 Texas: #73,555 of 125,132 inventorsTop 60%
Overall (All Time): #3,484,948 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6765666 System and method for inspecting bumped wafers Clyde Maxwell Guest, Rajiv Roy, Charles K. Harris, Weerakiat Wahawisan, Thomas Casey Carrington 2004-07-20