Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4947357 | Scan testing a digital system using scan chains in integrated circuits | W. Kem Stewart, Lester Crudele, Jonathan Logan Miller, Marco E. Riera | 1990-08-07 |
| 4896283 | Iterative real-time XY raster path generator for bounded areas | Harry F. Hunt | 1990-01-23 |