Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4947357 | Scan testing a digital system using scan chains in integrated circuits | W. Kem Stewart, Lester Crudele, Jonathan Logan Miller, Bruce E. Schurmann | 1990-08-07 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4947357 | Scan testing a digital system using scan chains in integrated circuits | W. Kem Stewart, Lester Crudele, Jonathan Logan Miller, Bruce E. Schurmann | 1990-08-07 |