Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4947357 | Scan testing a digital system using scan chains in integrated circuits | Lester Crudele, Jonathan Logan Miller, Marco E. Riera, Bruce E. Schurmann | 1990-08-07 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4947357 | Scan testing a digital system using scan chains in integrated circuits | Lester Crudele, Jonathan Logan Miller, Marco E. Riera, Bruce E. Schurmann | 1990-08-07 |