Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11804413 | Product design for test to enable electrical non-destructive test for measuring multi-chip interconnect defects | Chad Roberts, George J. Morales, Kartik Ramanujachar, Michael S. Chun, Anthony Zisko | 2023-10-31 |
| 10859627 | In-field system testing | Sreejit Chakravarty, Ramasubramanian Rajamani, Bryan J. Gran, Sorin Iacobovici, Neel Shah +3 more | 2020-12-08 |
| 10491381 | In-field system test security | Neel Shah, Kirk S. Yap, Amy L. Santoni, Michael Neve de Mevergnies, Sreejit Chakravarty +3 more | 2019-11-26 |
| 7142998 | Clock skew measurement circuit on a microprocessor die | Richard B. Watson, Jr., Sean M. Welch, David Bertucci | 2006-11-28 |
| 6671652 | Clock skew measurement circuit on a microprocessor die | Richard B. Watson, Jr., Sean M. Welch, David Bertucci | 2003-12-30 |