Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11804413 | Product design for test to enable electrical non-destructive test for measuring multi-chip interconnect defects | Chad Roberts, George J. Morales, Oscar Mendoza, Michael S. Chun, Anthony Zisko | 2023-10-31 |
| 7313490 | Wavelet analysis of one or more time domain reflectometry (TDR) signals to determine one or more characteristics of one or more anomalies in a wire | Kendall S. Wills, Michael D. Dockins | 2007-12-25 |
| 7130749 | Wavelet analysis of signals to determine characteristics of anomalies in a wire | Kendall S. Wills | 2006-10-31 |
| 6950761 | Wavelet analysis of one or more acoustic signals to identify one or more anomalies in an object | — | 2005-09-27 |