Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 11804413 | Product design for test to enable electrical non-destructive test for measuring multi-chip interconnect defects | Chad Roberts, George J. Morales, Oscar Mendoza, Kartik Ramanujachar, Anthony Zisko | 2023-10-31 | $30,374,000 |