Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11804413 | Product design for test to enable electrical non-destructive test for measuring multi-chip interconnect defects | Chad Roberts, George J. Morales, Oscar Mendoza, Kartik Ramanujachar, Michael S. Chun | 2023-10-31 |
| 10295576 | Ratiometric biasing for high impedance capacitive sensing | Matthew A. Zeleznik | 2019-05-21 |
| 9930451 | Elimination of 3D parasitic effects on microphone power supply rejection | John M. Muza | 2018-03-27 |
| 9502019 | Elimination of 3D parasitic effects on microphone power supply rejection | John M. Muza | 2016-11-22 |