Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7142998 | Clock skew measurement circuit on a microprocessor die | Richard B. Watson, Jr., Sean M. Welch, Oscar Mendoza | 2006-11-28 |
| 6952654 | Methods for calculating the voltage induced in a device | Cheolmin Park, Norbert Seifert, Wei D. Tai, Raymond D. Hokinson | 2005-10-04 |
| 6671652 | Clock skew measurement circuit on a microprocessor die | Richard B. Watson, Jr., Sean M. Welch, Oscar Mendoza | 2003-12-30 |
| 5870408 | Method and apparatus for on die testing | Sandeep Aggarwal, Marc E. Levitt | 1999-02-09 |