MS

Michael Sebald

Infineon Technologies Ag: 25 patents #266 of 7,486Top 4%
SA Siemens Aktiengesellschaft: 21 patents #286 of 22,248Top 2%
IA Infineon Technology Ag: 1 patents #1 of 46Top 3%
QA Qimonda Ag: 1 patents #252 of 575Top 45%
📍 Waischenfeld, DE: #1 of 10 inventorsTop 10%
Overall (All Time): #58,891 of 4,157,543Top 2%
48
Patents All Time

Issued Patents All Time

Showing 26–48 of 48 patents

Patent #TitleCo-InventorsDate
6696208 Method for experimentally verifying imaging errors in optical exposure units Gunther Czech, Ernst-Christian Richter, Ulrich Scheler 2004-02-24
6514663 Bottom resist Stefan Hien 2003-02-04
6306990 Film-forming polymers Stefan Hien 2001-10-23
6110637 Photoresists which are suitable for producing sub-micron size structures Recai Sezi, Rainer Leuschner, Horst Borndoerfer, Siegfried Birkle, Hellmut Ahne 2000-08-29
6063543 Radiation-sensitive mixture and its use Stefan Hien 2000-05-16
5733706 Dry-developable positive resist Recai Sezi, Rainer Leuschner, Horst Borndorfer, Eva Rissel, Hellmut Ahne +2 more 1998-03-31
5726094 Process for producing a diffusion region adjacent to a recess in a substrate Udo Schwalke, Ulrich Scheler 1998-03-10
5703186 Mixed polymers Recai Sezi, Horst Borndoerfer, Hellmut Ahne, Siegfried Birkle, Eberhard Kuehn +2 more 1997-12-30
5648195 Radiation-sensitive resist composition comprising a diazoketone Siegfried Birkle, Karin Preissner, Hans Jurgen Bestmann 1997-07-15
5616667 Copolymers Recai Sezi, Horst Borndoerfer, Hellmut Ahne, Siegfried Birkle, Eberhard Kuehn +2 more 1997-04-01
5512334 Method for the production of a bottom resist Rainer Leuschner, Recai Sezi 1996-04-30
5384220 Production of photolithographic structures Recai Sezi, Horst Borndoerfer, Rainer Leuschner, Siegfried Birkle, Hellmut Ahne 1995-01-24
5368901 Method for the production of a bottom resist Rainer Leuschner, Recai Sezi 1994-11-29
5360693 Positive o-quinone diazide photoresist containing base copolymer utilizing monomer having anhydride function and further monomer that increases etch resistance Recai Sezi, Rainer Leuschner, Seigfried Birkle, Hellmut Ahhe 1994-11-01
5275920 Method of dry development utilizing quinone diazide and basic polymer resist with latent image intensification through treatment with silicon-organic compound in water Recai Sezi, Rainer Leuschner, Siegfried Birkle, Hellmut Ahne 1994-01-04
5262283 Method for producing a resist structure Recai Sezi, Horst Borndorfer, Eva Rissel, Rainer Leuschner, Hellmut Ahne +1 more 1993-11-16
5250375 Photostructuring process Juergen Beck, Rainer Leuschner, Recai Sezi, Siegfried Birkle, Hellmut Ahne +1 more 1993-10-05
5234793 Method for dimensionally accurate structure transfer in bilayer technique wherein a treating step with a bulging agent is employed after development Recai Sezi, Rainer Leuschner, Siegfried Birkle, Hellmut Ahne 1993-08-10
5234794 Photostructuring method Rainer Leuschner, Recai Sezi, Siegfried Birkle, Hellmut Ahne 1993-08-10
5229258 Method for producing a resist structure Recai Sezi, Horst Borndorfer, Eva Rissel, Rainer Leuschner, Hellmut Ahne +1 more 1993-07-20
5194629 Process for producing N-tertiary butoxycarbonyl-maleinimide Eberhard Kuehn, Juergen Beck, Hellmut Ahne, Siegfried Birkle, Rainer Leuschner +2 more 1993-03-16
5173393 Etch-resistant deep ultraviolet resist process having an aromatic treating step after development Recai Sezi, Rainer Leuschner, Siegfried Birkle, Hellmut Ahne 1992-12-22
5171656 Photosensitive composition Juergen Beck, Rainer Leuschner, Recai Sezi, Hans Jurgen Bestmann 1992-12-15