| 12211703 |
Methods for forming a semiconductor device having a second semiconductor layer on a first semiconductor layer |
Hans-Joachim Schulze, Alexander Breymesser, Bernhard Goller, Matthias Kuenle, Francisco Javier Santos Rodriguez +1 more |
2025-01-28 |
| 11742215 |
Methods for forming a semiconductor device |
Hans-Joachim Schulze, Alexander Breymesser, Bernhard Goller, Matthias Kuenle, Francisco Javier Santos Rodriguez +1 more |
2023-08-29 |
| 10957767 |
Semiconductor device, silicon wafer and method of manufacturing a silicon wafer |
Nico Caspary, Hans-Joachim Schulze |
2021-03-23 |
| 10837120 |
Method of manufacturing CZ silicon wafers, and method of manufacturing a semiconductor device |
Johannes Freund, Thomas Wuebben, Hans-Joachim Schulze |
2020-11-17 |
| 10724149 |
Method of manufacturing CZ silicon wafers, and method of manufacturing a semiconductor device |
Johannes Freund, Thomas Wuebben, Hans-Joachim Schulze |
2020-07-28 |
| 10566198 |
Doping method |
Hans-Joachim Schulze, Johannes Baumgartl |
2020-02-18 |
| 10566424 |
Semiconductor device, silicon wafer and method of manufacturing a silicon wafer |
Nico Caspary, Hans-Joachim Schulze |
2020-02-18 |
| 10529838 |
Semiconductor device having a variable carbon concentration |
Hans-Joachim Schulze, Moriz Jelinek, Johannes Georg Laven, Werner Schustereder |
2020-01-07 |
| 10317338 |
Method and assembly for determining the carbon content in silicon |
Naveen Goud Ganagona, Moriz Jelinek, Hans-Joachim Schulze, Werner Schustereder |
2019-06-11 |
| 10319599 |
Methods of planarizing SiC surfaces |
Hans-Joachim Schulze, Roland Rupp |
2019-06-11 |
| 10273597 |
Method of manufacturing CZ silicon wafers, and method of manufacturing a semiconductor device |
Johannes Freund, Thomas Wuebben, Hans-Joachim Schulze |
2019-04-30 |
| 10026816 |
Semiconductor wafer and manufacturing method |
Hans-Joachim Schulze |
2018-07-17 |
| 10014400 |
Semiconductor device having a defined oxygen concentration |
Nico Caspary, Mohammad Momeni, Reinhard Ploss, Francisco Javier Santos Rodriguez, Hans-Joachim Schulze |
2018-07-03 |
| 9972488 |
Method of reducing defects in an epitaxial layer |
Hans-Joachim Schulze, Johannes Baumgartl |
2018-05-15 |
| 9972704 |
Method for forming a semiconductor device and a semiconductor device |
Moriz Jelinek, Johannes Georg Laven, Hans-Joachim Schulze, Werner Schustereder |
2018-05-15 |
| 9934988 |
Method for processing a silicon wafer |
Werner Schustereder, Hans-Joachim Schulze, Sandeep Walia |
2018-04-03 |
| 9779931 |
Method of manufacturing semiconductor wafers and method of manufacturing a semiconductor device |
Johannes Freund, Hans-Joachim Schulze |
2017-10-03 |
| 9754787 |
Method for treating a semiconductor wafer |
Johannes Georg Laven, Hans-Joachim Schulze, Stephan Voss, Alexander Breymesser, Alexander Susiti +1 more |
2017-09-05 |
| 9728395 |
Method for manufacturing a semiconductor wafer, and semiconductor device having a low concentration of interstitial oxygen |
Nico Caspary, Mohammad Momeni, Reinhard Ploss, Francisco Javier Santos Rodriguez, Hans-Joachim Schulze |
2017-08-08 |
| 9721907 |
Wafer edge shape for thin wafer processing |
Hans-Joachim Schulze |
2017-08-01 |
| 9559020 |
Method for postdoping a semiconductor wafer |
Reinhard Ploss, Hans-Joachim Schulze |
2017-01-31 |
| 9536838 |
Single crystal ingot, semiconductor wafer and method of manufacturing semiconductor wafers |
Johannes Freund, Hans-Joachim Schulze |
2017-01-03 |
| 9312120 |
Method for processing an oxygen containing semiconductor body |
Hans-Joachim Schulze |
2016-04-12 |
| 9245811 |
Method for postdoping a semiconductor wafer |
Reinhard Ploss, Hans-Joachim Schulze |
2016-01-26 |
