DW

David Wallis

Infineon Technologies Ag: 6 patents #1,452 of 7,486Top 20%
CL Cambridge Enterprise Limited: 3 patents #57 of 688Top 9%
QL Qinetiq Limited: 3 patents #94 of 677Top 15%
SK Semiconductor 300 Gmbh & Co. Kg: 2 patents #1 of 25Top 4%
AL Anvil Semiconductors Limited: 2 patents #2 of 8Top 25%
Motorola: 1 patents #6,475 of 12,470Top 55%
TM The University Of Manchester: 1 patents #75 of 270Top 30%
Overall (All Time): #396,339 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12283794 Polarised emission from quantum wires in cubic GaN Rachel A. OLIVER, Menno Kappers, Philip Dawson, Stephen Church, David Binks 2025-04-22
11817315 Zincblende structure group III-nitride Martin Frentrup, Menno Kappers, Suman-Lata Sahonta 2023-11-14
11302530 Zincblende structure group III-nitride Martin Frentrup, Menno Kappers, Suman-Lata Sahonta 2022-04-12
8575595 P-type semiconductor devices 2013-11-05
7390742 Method for producing a rewiring printed circuit board Axel Brintzinger, Stefan Ruckmich, Octavio Trovarelli, Ingo Uhlendorf 2008-06-24
7323764 Buffer structure for modifying a silicon substrate 2008-01-29
7235859 Arrangement and process for protecting fuses/anti-fuses Axel Brintzinger, Octavio Trovarelli, Wolfgang Leiberg 2007-06-26
7169647 Connection between a semiconductor chip and an external conductor structure and method for producing it Octavio Trovarelli, Ingo Uhlendorf, Axel Brintzinger 2007-01-30
6907107 Method and apparatus for the analysis of material composition Andrew Keir, Martin Trevor Emeny 2005-06-14
6752694 Apparatus for and method of wafer grinding Manfred Schneegans, Michael Roesner 2004-06-22
6709953 Method of applying a bottom surface protective coating to a wafer, and wafer dicing method Barbara Vasquez, Sylvia Baumann Winter 2004-03-23
6633379 Apparatus and method for measuring the degradation of a tool Michael Roesner, Manfred Schneegans 2003-10-14