Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12259660 | Inspection method and inspection platform for lithography | Cheng-Hsien Chen, Shu-Chun Liao, Shau-Wei Hsu, Tsung-Ying Chung, Yi-Chen Chuang | 2025-03-25 |
| 12188883 | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate | Bo He, Chun-Ting Liu, Wen-Li Wu | 2025-01-07 |
| 11867595 | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate | Chun-Ting Liu, Wen-Li Wu, Bo He, Guo-Dung Chen, Sheng-Hsun Wu | 2024-01-09 |
| 11579099 | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate | Chun-Ting Liu, Wen-Li Wu, Bo He, Guo-Dung Chen, Sheng-Hsun Wu | 2023-02-14 |
| 11348236 | Automated visual inspection of syringes | Rahul Devraj Solanki, Mark William Sabini, Yuanzhe Dong, Hao Sheng, Gopi Prashanth Gopal +2 more | 2022-05-31 |
| 11287253 | Device and method applicable for measuring ultrathin thickness of film on substrate | Chun-Ting Liu, Han-Yu CHANG, Bo He, Guo-Dung Chen, Wen-Li Wu | 2022-03-29 |
| 10545082 | Apparatus for mixing solution | Hsin-Chia Ho, Guo-Dung Chen, Yen-Liang Lin | 2020-01-28 |
| 10352694 | Contactless dual-plane positioning method and device | Guo-Dung Chen, Bo He | 2019-07-16 |
| 10151713 | X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof | Wen-Li Wu, Yun-San Chien, Shyh-Shin Ferng, Yi-Hung Lin | 2018-12-11 |
| 9847242 | Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurements | Wen-Li Wu, Yen-Song Chen, Yun-San Chien, Hsin-Chia Ho | 2017-12-19 |
| 9625365 | System and method for monitoring particles in solution | Hsin-Chia Ho, Guo-Dung Chen, Yen-Liang Lin | 2017-04-18 |
| 9390888 | Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate | Wen-Li Wu, Yun-San Chien, Yen-Song Chen, Hsin-Chia Ho | 2016-07-12 |
| 9297772 | Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements | Wen-Li Wu | 2016-03-29 |