Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11867595 | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate | Chun-Ting Liu, Wen-Li Wu, Bo He, Sheng-Hsun Wu, Wei-En Fu | 2024-01-09 |
| 11579099 | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate | Chun-Ting Liu, Wen-Li Wu, Bo He, Sheng-Hsun Wu, Wei-En Fu | 2023-02-14 |
| 11287253 | Device and method applicable for measuring ultrathin thickness of film on substrate | Chun-Ting Liu, Han-Yu CHANG, Bo He, Wen-Li Wu, Wei-En Fu | 2022-03-29 |
| 10545082 | Apparatus for mixing solution | Hsin-Chia Ho, Wei-En Fu, Yen-Liang Lin | 2020-01-28 |
| 10352694 | Contactless dual-plane positioning method and device | Bo He, Wei-En Fu | 2019-07-16 |
| 9625365 | System and method for monitoring particles in solution | Hsin-Chia Ho, Wei-En Fu, Yen-Liang Lin | 2017-04-18 |