WW

Wen-Li Wu

IT ITRI: 8 patents #738 of 9,619Top 8%
MT Monsanto Technology: 3 patents #419 of 1,657Top 30%
UC US Dept of Commerce: 2 patents #177 of 1,030Top 20%
TSMC: 1 patents #8,466 of 12,232Top 70%
📍 Hsinchu, MD: #4 of 10 inventorsTop 40%
Overall (All Time): #329,417 of 4,157,543Top 8%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12188883 X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate Bo He, Chun-Ting Liu, Wei-En Fu 2025-01-07
11867595 X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate Chun-Ting Liu, Bo He, Guo-Dung Chen, Sheng-Hsun Wu, Wei-En Fu 2024-01-09
11579099 X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate Chun-Ting Liu, Bo He, Guo-Dung Chen, Sheng-Hsun Wu, Wei-En Fu 2023-02-14
11287253 Device and method applicable for measuring ultrathin thickness of film on substrate Chun-Ting Liu, Han-Yu CHANG, Bo He, Guo-Dung Chen, Wei-En Fu 2022-03-29
10424458 Electron reflectometer and process for performing shape metrology Lawrence Friedman 2019-09-24
10151713 X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof Yun-San Chien, Wei-En Fu, Shyh-Shin Ferng, Yi-Hung Lin 2018-12-11
9847242 Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurements Yen-Song Chen, Wei-En Fu, Yun-San Chien, Hsin-Chia Ho 2017-12-19
9390888 Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate Yun-San Chien, Wei-En Fu, Yen-Song Chen, Hsin-Chia Ho 2016-07-12
9297772 Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements Wei-En Fu 2016-03-29
8436996 Apparatus and method for enhancing the electromagnetic signal of a sample Shuhul Kang 2013-05-07
4972720 Thermal technique for determining interface and/or interply strength in composites 1990-11-27
4276348 High tenacity polyethylene fibers and process for producing same William B. Black 1981-06-30
4244907 Spin-texture process 1981-01-13
4228118 Process for producing high tenacity polyethylene fibers William B. Black 1980-10-14