Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12259660 | Inspection method and inspection platform for lithography | Cheng-Hsien Chen, Shu-Chun Liao, Wei-En Fu, Tsung-Ying Chung, Yi-Chen Chuang | 2025-03-25 |
| 8212931 | Image processing and controlling system | Cheng-Hsien Chen, Zong-Ying Chung, Bao-Jen Pong | 2012-07-03 |