Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733295 | Methods and systems for identifying flaws and bugs in integrated circuits, for example, microprocessors | Arun Joseph, Wolfgang Roesner, Viresh Paruthi, Shiladitya Ghosh | 2023-08-22 |
| 11036905 | Hierarchical power analysis using improved activity abstraction and capacitance abstraction by accounting for design heterogeneity extremities | Arun Joseph, Rahul M. Rao, Shashidhar Reddy | 2021-06-15 |
| 10884055 | Leakage power characterization at high temperatures for an integrated circuit | Diyanesh B. Chinnakkonda Vidyapoornachary, Anand Haridass, Arun Joseph, Charles R. Lefurgy | 2021-01-05 |
| 10572614 | Method for efficient localized self-heating analysis using location based DeltaT analysis | Nagashyamala R. Dhanwada, Arun Joseph, Arya Madhusoodanan | 2020-02-25 |
| 10204198 | Method for efficient localized self-heating analysis using location based deltat analysis | Nagashyamala R. Dhanwada, Arun Joseph, Arya Madhusoodanan | 2019-02-12 |
| 10031180 | Leakage power characterization at high temperatures for an integrated circuit | Diyanesh B. Chinnakkonda Vidyapoornachary, Anand Haridass, Arun Joseph, Charles R. Lefurgy | 2018-07-24 |