Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
RG

Robert Glen Gerowitz — 16 Patents

IBM: 16 patents #6,980 of 70,183Top 10%
Raleigh, NC: #507 of 6,378 inventorsTop 8%
North Carolina: #3,044 of 45,564 inventorsTop 7%
Overall (All Time): #284,196 of 4,157,543Top 7%
16 Patents All Time
Robert Glen Gerowitz has been granted 16 US patents while listed as an inventor at IBM. The first was granted in 2001 and the most recent in May 2021. Robert Glen Gerowitz ranks #284,196 of 4,157,543 US inventors in our database (top 6.8%). Patent records list Robert Glen Gerowitz in Raleigh, NC, US.

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11016144 Testing integrated circuit designs containing multiple phase rotators Sarah B. Higgins, Joseph A. Iadanza 2021-05-25 $5,474,000
10761136 Testing integrated circuit designs containing multiple phase rotators Sarah B. Higgins, Joseph A. Iadanza 2020-09-01 $3,521,000
10585140 Testing integrated circuit designs containing multiple phase rotators Sarah B. Higgins, Joseph A. Iadanza 2020-03-10 $1,254,000
9927489 Testing integrated circuit designs containing multiple phase rotators Sarah B. Higgins, Joseph A. Iadanza 2018-03-27 $2,459,000
8135571 Validating manufacturing test rules pertaining to an electronic component Carisa Anne Cassani, Michael Patrick Muhlada, Chad Everett Winemiller 2012-03-13 $7,610,000
8136059 Indeterminate state logic insertion Michael Patrick Muhlada, Chad Everett Winemiller 2012-03-13 $7,610,000
8065641 Automatically creating manufacturing test rules pertaining to an electronic component Michael Patrick Muhlada, Chad Everett Winemiller 2011-11-22 $22,584,000
7865786 Scanned memory testing of multi-port memory arrays Kenichi Tsuchiya 2011-01-04 $2,931,000
7768315 Multiplexor with leakage power regulator Zhibin Cheng, Claudia M. Tartevet 2010-08-03 $4,325,000
7646210 Method and system for low-power level-sensitive scan design latch with power-gated logic Zhibin Cheng, Claudia M. Tartevet 2010-01-12 $8,801,000
7506225 Scanned memory testing of multi-port memory arrays Kenichi Tsuchiya 2009-03-17 $4,806,000
7127691 Method and apparatus for manufacturing test generation R. Thomas Cruz, Claudia M. Tartevet 2006-10-24 $14,060,000
6681356 Scan chain connectivity Benjamin Floering, Kenneth Patrick Zabrycki 2004-01-20 $10,094,000
6519757 Hardware design language generation for input/output logic level Bryan K. Bullis 2003-02-11 $11,665,000
6407569 Integrated circuit with in situ circuit arrangement for testing integrity of differential receiver inputs Jeffrey Paul Boettler, William Noon, Howard James Schubert, Jr., Chad Everett Winemiller 2002-06-18 $15,516,000
6222380 High speed parallel/serial link for data communication Carl Thomas Gray, John Marshall, Christopher G. Riedle, Raymond Paul Rizzo 2001-04-24 $20,927,000