Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
PJ

Patrick M. West, Jr.

IBM: 35 patents #2,774 of 70,183Top 4%
Waukesha, WI: #29 of 1,162 inventorsTop 3%
Wisconsin: #765 of 40,088 inventorsTop 2%
Overall (All Time): #96,440 of 4,157,543Top 3%
35 Patents All Time

Issued Patents All Time

Showing 26–35 of 35 patents

Patent #TitleCo-InventorsDate
8516227 Set program parameter instruction Jane H. Bartik, Lisa C. Heller, Damian L. Osisek, Donald W. Schmidt, Phil C. Yeh 2013-08-20
8478966 Query sampling information instruction Jane H. Bartik, Lisa C. Heller, Damian L. Osisek, Donald W. Schmidt, Phil C. Yeh 2013-07-02
8417837 Set sampling controls instruction Jane H. Bartik, Lisa C. Heller, Damian L. Osisek, Donald W. Schmidt, Phil C. Yeh 2013-04-09
8209668 Method and system for measuring the performance of a computer system on a per logical partition basis Jane H. Bartik, Michael Billeci, Lisa C. Heller, Donald G. O'Brien, Bruce Wagar 2012-06-26
8127118 Microarchitecture, method and computer program product for efficient data gathering from a set of trace arrays Jane H. Bartik, Martin Recktenwald, Chung-Lung K. Shum, Scott Barnett Swaney 2012-02-28
7983372 Method, system and computer program product for an even sampling spread over differing clock domain boundaries Jane H. Bartik, Willm Hinrichs, Martin Recktenwald 2011-07-19
7908518 Method, system and computer program product for failure analysis implementing automated comparison of multiple reference models Vimal M. Kapadia, Christopher A. Krygowski, Timothy J. Slegel 2011-03-15
7881906 Method, system and computer program product for event-based sampling to monitor computer system performance Jane H. Bartik, Willm Hinrichs, Martin Recktenwald 2011-02-01
7870438 Method, system and computer program product for sampling computer system performance data Jane H. Bartik, Martin Recktenwald, Chung-Lung K. Shum, Scott Barnett Swaney 2011-01-11
7827321 Central processing unit measurement facility Jane H. Bartik, Lisa C. Heller, Damian L. Osisek, Donald W. Schmidt, Phil C. Yeh 2010-11-02