Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10426085 | Centrifugal fan rotor and apparatus incorporating the centrifugal fan rotor | Damir Cavkusic, Ben Richard, Mitchell Lee | 2019-10-01 |
| 10130032 | Volume extending assembly for combine storage tank | Damir Cavkusic, Ben Richard, Mitchell Lee | 2018-11-20 |
| 9848534 | Agricultural harvesting unit and method of harvesting using the unit | Damir Cavkusic, Ben Richard, Daniel Ross, Mitchell Lee | 2017-12-26 |
| RE38029 | Wafer polishing and endpoint detection | William J. Cote | 2003-03-11 |
| 6267655 | Retaining ring for wafer polishing | David E. Weldon, Shu-Hsin Kao, Charles J. Regan, Linh X. Can | 2001-07-31 |
| 5836807 | Method and structure for polishing a wafer during manufacture of integrated circuits | — | 1998-11-17 |
| 5760475 | Refractory metal-titanium nitride conductive structures | John Cronin, Carter W. Kaanta, Pei-Ing Lee | 1998-06-02 |
| 5733175 | Polishing a workpiece using equal velocity at all points overlapping a polisher | — | 1998-03-31 |
| 5702290 | Block for polishing a wafer during manufacture of integrated circuits | — | 1997-12-30 |
| 5607341 | Method and structure for polishing a wafer during manufacture of integrated circuits | — | 1997-03-04 |
| 5510652 | Polishstop planarization structure | Peter A. Burke | 1996-04-23 |
| 5356513 | Polishstop planarization method and structure | Peter A. Burke | 1994-10-18 |
| 5242524 | Device for detecting an end point in polishing operations | Brian J. Machesney, Edward J. Nowak | 1993-09-07 |
| 5213655 | Device and method for detecting an end point in polishing operation | Brian J. Machesney, Edward J. Nowak | 1993-05-25 |
| 5136124 | Method of forming conductors within an insulating substrate | John Cronin, Carter W. Kaanta | 1992-08-04 |
| 5132617 | Method of measuring changes in impedance of a variable impedance load by disposing an impedance connected coil within the air gap of a magnetic core | Brian J. Machesney, Edward J. Nowak | 1992-07-21 |
| 4985990 | Method of forming conductors within an insulating substrate | John Cronin, Carter W. Kaanta | 1991-01-22 |
| 4956313 | Via-filling and planarization technique | William J. Cote, Carter W. Kaanta, James Paulsen | 1990-09-11 |
| 4934102 | System for mechanical planarization | James Paulsen, Brian J. Machesney, Daniel J. Venditti, Jr., Christopher R. Whitaker | 1990-06-19 |
| 4910155 | Wafer flood polishing | William J. Cote | 1990-03-20 |
| 4838991 | Process for defining organic sidewall structures | William J. Cote, Donald M. Kenney, Michael L. Kerbaugh, Jeffrey A. Robinson, Robert W. Sweetser | 1989-06-13 |
| 4793895 | In situ conductivity monitoring technique for chemical/mechanical planarization endpoint detection | Carter W. Kaanta | 1988-12-27 |
| 4776087 | VLSI coaxial wiring structure | John Cronin | 1988-10-11 |