KE

Karl R. Erickson

IBM: 77 patents #896 of 70,183Top 2%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
HG HGST: 1 patents #1,032 of 1,677Top 65%
📍 Rochester, MN: #54 of 3,042 inventorsTop 2%
🗺 Minnesota: #343 of 52,454 inventorsTop 1%
Overall (All Time): #22,703 of 4,157,543Top 1%
80
Patents All Time

Issued Patents All Time

Showing 51–75 of 80 patents

Patent #TitleCo-InventorsDate
8921199 Precision IC resistor fabrication Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2014-12-30
8895436 Implementing enhanced power supply distribution and decoupling utilizing TSV exclusion zone Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2014-11-25
8816470 Independently voltage controlled volume of silicon on a silicon on insulator chip Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2014-08-26
8754499 Semiconductor chip with power gating through silicon vias Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2014-06-17
8735975 Implementing semiconductor soc with metal via gate node high performance stacked transistors Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2014-05-27
8617939 Enhanced thin film field effect transistor integration into back end of line Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2013-12-31
8592921 Deep trench embedded gate transistor Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Ulmann, Kelly L. Williams 2013-11-26
8574982 Implementing eDRAM stacked FET structure David P. Paulsen, John E. Sheets, II, Kelly L. Williams 2013-11-05
8575613 Implementing vertical signal repeater transistors utilizing wire vias as gate nodes Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2013-11-05
8525245 eDRAM having dynamic retention and performance tradeoff Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2013-09-03
8492207 Implementing eFuse circuit with enhanced eFuse blow operation Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2013-07-23
8492220 Vertically stacked FETs with series bipolar junction transistor Phil C. Paone, David P. Paulsen, John E. Sheets, II, Kelly L. Williams 2013-07-23
8456187 Implementing temporary disable function of protected circuitry by modulating threshold voltage of timing sensitive circuit Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2013-06-04
8435851 Implementing semiconductor SoC with metal via gate node high performance stacked transistors Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2013-05-07
8395186 Implementing vertical signal repeater transistors utilizing wire vias as gate nodes Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2013-03-12
8384414 Implementing hacking detection and block function at indeterminate times with priorities and limits Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams 2013-02-26
7915949 Implementing eFuse resistance determination before initiating eFuse blow Phil C. Paone, David P. Paulsen, John E. Sheets, II 2011-03-29
7696565 FinFET body contact structure Richard Lee Donze, William Paul Hovis, Terrance Wayne Kueper, John E. Sheets, II, Jon Robert Tetzloff 2010-04-13
7659733 Electrical open/short contact alignment structure for active region vs. gate region Richard Lee Donze, William Paul Hovis, John Edward Sheet, II, Jon Robert Tetzloff 2010-02-09
7551470 Non volatile memory RAD-hard (NVM-rh) system John A. Fifield, Chandrasekara Kothandaraman, Phil C. Paone, William R. Tonti 2009-06-23
7550789 Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperable Anthony R. Bonaccio, John A. Fifield, Chandrasekharan Kothandaraman, Phil C. Paone, William R. Tonti 2009-06-23
7453272 Electrical open/short contact alignment structure for active region vs. gate region Richard Lee Donze, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff 2008-11-18
7442583 Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperable Anthony R. Bonaccio, John A. Fifield, Chandrasekharan Kothandaraman, Phil C. Paone, William R. Tonti 2008-10-28
7336095 Changing chip function based on fuse states John A. Fifield, Chandrasekharan Kothandaraman, Phil C. Paone, William R. Tonti 2008-02-26
7336086 Measurement of bias of a silicon area using bridging vertices on polysilicon shapes to create an electrical open/short contact structure Richard Lee Donze, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff 2008-02-26