Issued Patents All Time
Showing 51–58 of 58 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7971120 | Method and apparatus for covering a multilayer process space during at-speed testing | Yiyu Shi, Chandramouli Visweswariah, Vladimir Zolotov | 2011-06-28 |
| 7886247 | Method and apparatus for statistical path selection for at-speed testing | Hanif Fatemi, Chandramouli Visweswariah, Vladimir Zolotov | 2011-02-08 |
| 7873925 | Method and apparatus for computing test margins for at-speed testing | Chandramouli Visweswariah, Vladimir Zolotov | 2011-01-18 |
| 7861199 | Method and apparatus for incrementally computing criticality and yield gradient | Chandramouli Visweswariah, Vladimir Zolotov | 2010-12-28 |
| 7814448 | Representing and propagating a variational voltage waveform in statistical static timing analysis of digital circuits | Soroush Abbaspour, David J. Hathaway, Chandramouli Visweswariah, Vladimir Zolotov | 2010-10-12 |
| 7620921 | IC chip at-functional-speed testing with process coverage evaluation | Eric A. Foreman, Gary D. Grise, Peter A. Habitz, Vikram Iyengar, David E. Lackey +2 more | 2009-11-17 |
| 7480880 | Method, system, and program product for computing a yield gradient from statistical timing | Chandramouli Visweswariah, Vladimir Zolotov | 2009-01-20 |
| 7437697 | System and method of criticality prediction in statistical timing analysis | Natesan Venkateswaran, Chandramouli Viswewariah, Vladimir Zolotov | 2008-10-14 |